NickelMaghrebV1, Main, Exploration, bibRecord, 000107

Kinetics of growth and consumption of Ni rich phases

Identifieur interne : 000107 ( Main/Exploration ); précédent : 000106; suivant : 000108

Kinetics of growth and consumption of Ni rich phases

Auteurs : G. Tellouche-Derafa [Algérie, France] ; K. Hoummada [France] ; A. Derafa [Algérie] ; I. Blum [France] ; A. Portavoce [France] ; D. Mangelinck [France]

Source :

Microelectronic engineering [ 0167-9317 ] ; 2014.

RBID : Pascal:14-0138911

Descripteurs français

Pascal (Inist)
- Cinétique, In situ, Diffraction RX, Recuit isotherme, Durée vie, Epaisseur, Phénomène transitoire, Modèle thermodynamique, Nickel, 6580.
Wicri :
- topic : Nickel.

English descriptors

KwdEn :
- In situ, Isothermal annealing, Kinetics, Lifetime, Nickel, Thermodynamic model, Thickness, Transients, XRD.

Abstract

In situ X-ray diffraction measurements performed during isothermal annealing show that the life time of θ-Ni₂Si depends on the initial Ni thickness. A slow kinetic of consumption of θ-Ni₂Si is observed during the reaction of 50 nm Ni with Si substrate, while a fast rate of consumption of θ-Ni₂Si is observed when θ-Ni₂Si is a transient phase. The kinetics of growth and consumption of Ni-rich phases is discussed.

Affiliations:

Links toward previous steps (curation, corpus...)

to stream PascalFrancis, to step Corpus: 000026
to stream PascalFrancis, to step Curation: 000415
to stream PascalFrancis, to step Checkpoint: 000021
to stream Main, to step Merge: 000108
to stream Main, to step Curation: 000107

Le document en format XML

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<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>In situ</term>
<term>Isothermal annealing</term>
<term>Kinetics</term>
<term>Lifetime</term>
<term>Nickel</term>
<term>Thermodynamic model</term>
<term>Thickness</term>
<term>Transients</term>
<term>XRD</term>
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<keywords scheme="Pascal" xml:lang="fr"><term>Cinétique</term>
<term>In situ</term>
<term>Diffraction RX</term>
<term>Recuit isotherme</term>
<term>Durée vie</term>
<term>Epaisseur</term>
<term>Phénomène transitoire</term>
<term>Modèle thermodynamique</term>
<term>Nickel</term>
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<front><div type="abstract" xml:lang="en">In situ X-ray diffraction measurements performed during isothermal annealing show that the life time of θ-Ni<sub>2</sub>
Si depends on the initial Ni thickness. A slow kinetic of consumption of θ-Ni<sub>2</sub>
Si is observed during the reaction of 50 nm Ni with Si substrate, while a fast rate of consumption of θ-Ni<sub>2</sub>
Si is observed when θ-Ni<sub>2</sub>
Si is a transient phase. The kinetics of growth and consumption of Ni-rich phases is discussed.</div>
</front>
</TEI>
<affiliations><list><country><li>Algérie</li>
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Serveur d'exploration sur le nickel au Maghreb

Kinetics of growth and consumption of Ni rich phases

Kinetics of growth and consumption of Ni rich phases

Source :

Descripteurs français

English descriptors

Abstract

Links toward previous steps (curation, corpus...)

Le document en format XML

Pour manipuler ce document sous Unix (Dilib)

Pour mettre un lien sur cette page dans le réseau Wicri